CN114217217A - Switching dynamic characteristic test circuit and system of inverter - Google Patents
Switching dynamic characteristic test circuit and system of inverter Download PDFInfo
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- CN114217217A CN114217217A CN202111533971.9A CN202111533971A CN114217217A CN 114217217 A CN114217217 A CN 114217217A CN 202111533971 A CN202111533971 A CN 202111533971A CN 114217217 A CN114217217 A CN 114217217A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
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Abstract
本发明提供一种逆变器的开关动态特性测试电路及系统，包括：支撑电容，串接在待测逆变器的高压电源输入端之间；第一可控开关，串接在所述支撑电容的一端与外接的高压直流电源之间，并根据外部的控制信号接通或断开；电压表，与所述支撑电容相并联；泄放单元，串接在所述支撑电容与高压直流电源正极相连的一端和电源地之间；可变负载，串接在待测逆变器的负载端之间。本发明提供了一个封闭、可靠、安全的测试环境，能够在不同测试地点、不同布置时，得到一致且精准的测试结果；本发明还设有多种档位的可变负载，适用于多种测试工况，可大幅提高测试效率，降低生产成本。
The invention provides a switching dynamic characteristic testing circuit and system of an inverter, comprising: a support capacitor connected in series between the input ends of the high-voltage power supply of the inverter to be tested; a first controllable switch connected in series with the support One end of the capacitor and the external high-voltage DC power supply are connected or disconnected according to the external control signal; the voltmeter is connected in parallel with the support capacitor; the discharge unit is connected in series with the support capacitor and the high-voltage DC power supply Between the end connected to the positive pole and the power supply ground; the variable load is connected in series between the load ends of the inverter to be tested. The present invention provides a closed, reliable and safe test environment, and can obtain consistent and accurate test results in different test locations and different arrangements; the present invention is also provided with variable loads of various gears, and is suitable for various The test conditions can greatly improve the test efficiency and reduce the production cost.
Description
Technical Field
The invention relates to the technical field of inverter testing, in particular to a circuit and a system for testing the dynamic characteristics of a switch of an inverter.
Background
The electromagnetic interference problem of the electric automobile is mainly caused by a power inverter, and a switching device forming the inverter generates high-frequency and high-amplitude voltage and current transient in the dynamic switching process and is spread outwards through a complex parasitic circuit to generate electromagnetic interference. Therefore, controlling the electromagnetic interference performance of the inverter becomes an important link for electric vehicle development, and in order to evaluate the electromagnetic interference performance of the inverter, voltage and current transient processes of a switching device of the inverter during switching on and switching off, namely the dynamic characteristics of the switch, need to be quantitatively evaluated. With the development of high-power silicon carbide semiconductor technology, the operating voltage of a power inverter mounted on an electric automobile is improved from the current 300V-400V level to the 800V-1200V level, and the switching frequency of a switching device of the power inverter is improved from about 10kHz to over 100 kHz. The electromagnetic interference generated in the switching process of the silicon carbide switching device is more obvious, the amplitude and the frequency of the silicon carbide switching device are higher, and the electromagnetic interference performance of the silicon carbide switching device must be controlled more strictly.
Referring to fig. 1, a conventional system for testing the switching dynamic characteristics of an inverter mainly includes a high voltage power supply, a supporting capacitor, an air core inductor, a voltage sensor, and a current sensor, and uses a wire to connect a circuit, which has the following problems:
(1) the silicon carbide inverter is used as a strong interference source, and the traditional test system does not consider parasitic parameters additionally introduced by building a test circuit, so that the direct influence on a switch waveform test result is caused, and the switching characteristics of the silicon carbide inverter cannot be accurately reflected;
(2) the electric automobile actually runs in different temperature and humidity environments, the environmental temperature and humidity directly influence the impedance performance of an inverter and a lead, and influence the accuracy of a sensor, and the traditional test system does not consider the change of the temperature and humidity environment;
(3) the working voltage and the working current of the silicon carbide inverter are larger, and the traditional test system does not fully consider a discharge loop of accumulated charges of the support capacitor, so that the safety risk of the test is larger;
(4) the test working condition of the silicon carbide inverter is more complex, and the traditional test system adopts a hollow inductive load with a fixed inductance value and cannot adapt to the target working condition required by the test;
(5) the high-voltage power supply end of the test system is externally powered, external interference current is easily transmitted into the test system, and the interference current introduced by the high-voltage power supply end is not fully considered in the traditional test system, so that random errors exist in the test result;
(6) when the specification of the inverter to be tested is changed at a test site, the input and output impedance of the system may be changed, and the impedance of the source end and the load end of the traditional test system is unstable, so that the switch test results of the same inverter to be tested are different when the test site and the arrangement are different.
Disclosure of Invention
In view of the above-mentioned drawbacks of the prior art, an object of the present invention is to provide a circuit and a system for testing switching dynamics of an inverter, which are used to solve the problems of poor testing result and high safety risk of the switching dynamics testing system of the inverter in the prior art.
A first aspect of the present invention provides a switching dynamics test circuit of an inverter, including:
the support capacitor is connected between the input ends of the high-voltage power supplies of the inverter to be tested in series;
the first controllable switch is connected between one end of the supporting capacitor and an external high-voltage direct-current power supply in series and is switched on or switched off according to an external control signal;
the voltmeter is connected with the supporting capacitor in parallel;
the discharge unit is connected between one end of the support capacitor connected with the positive electrode of the high-voltage direct-current power supply and a power ground in series;
and the variable load is connected between the load ends of the inverter to be tested in series.
In an embodiment of the present invention, the bleeding unit includes a discharge resistor and a second controllable switch;
one end of the discharge resistor is connected with the support capacitor, and the other end of the discharge resistor is connected with the second controllable switch;
the other end of the second controllable switch is connected with a power ground;
the second controllable switch is switched on or off according to an external control signal.
In an embodiment of the present invention, the variable load includes a plurality of load units connected in parallel;
each of the load units includes an air-core reactor and a third controllable switch connected in series, and the third controllable switch is turned on or off according to an external control signal.
In an embodiment of the invention, the support capacitor, the first controllable switch, the voltmeter, the discharge unit and the input end of the high voltage power supply of the inverter to be tested are electrically connected with an external high voltage direct current power supply through copper bars respectively.
In an embodiment of the present invention, the variable load is electrically connected to a load terminal of the inverter to be tested through a copper bar.
The second aspect of the present invention also provides a switching dynamic characteristic testing system of an inverter, including:
the power distribution room is internally provided with a high-voltage direct-current power supply and a low-voltage direct-current power supply;
the test chamber is provided with:
a glass bin with an opening at the bottom;
the test circuit is arranged in the glass bin and used for testing the inverter to be tested, wherein the test circuit is the switch dynamic characteristic test circuit of the inverter according to any one of claims 1 to 5;
the high-voltage impedance stabilizing network is connected between the high-voltage direct-current power supply and the high-voltage input end of the test circuit in series;
the low-voltage impedance stabilizing network is connected between the low-voltage direct-current power supply and the low-voltage input end of the test circuit in series;
the control room, be equipped with in the control room:
a signal generator for outputting a test signal to the test circuit;
and the oscilloscope is used for displaying the test result of the inverter to be tested.
In an embodiment of the present invention, the power distribution room, the test room and the control room are all shielded rooms.
In an embodiment of the present invention, the test chamber further includes:
a test table;
the insulating foam board set up in on the test table, the glass storehouse set up in on the insulating foam board, just the glass storehouse with the border department of insulating foam board contact passes through plastic seal.
In an embodiment of the present invention, a movable door is disposed on the glass bin and used for placing in or taking out the inverter to be tested;
and a plurality of fixing clamps are further arranged in the glass bin, and each fixing clamp is fixedly arranged on the insulating foam board and is used for fixing the inverter to be tested, the differential voltage probe and the flexible current probe of the oscilloscope and the radio frequency coaxial cable of the signal generator.
In an embodiment of the present invention, the glass bin further includes:
the temperature control module comprises a temperature sensor and a temperature execution unit, and the temperature execution unit adjusts the temperature in the glass bin according to temperature data detected by the temperature sensor;
and the humidity control module comprises a humidity sensor and a humidity execution unit, and the humidity execution unit adjusts the humidity in the glass bin according to the humidity data detected by the humidity sensor. .
As described above, the switching dynamic characteristic test circuit and system of the inverter according to the present invention have the following advantages:
1. the discharge unit is arranged in the test circuit of the inverter to be tested, so that charges accumulated by the support capacitor can be discharged to a power supply ground after the test is finished, and the safety of equipment and personnel is effectively protected;
2. the test circuit is provided with a variable load, and can adapt to various test working conditions by adjusting gears;
3. the test circuit is arranged in the glass bin, so that a closed and reliable test environment is provided;
4. the test power supply is connected to the test circuit through the pair of linear impedance stabilizing networks, so that external interference current can be isolated, the input and output impedance of the test circuit is stabilized, and the test result is kept consistent when different test sites and different arrangements are ensured.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the description of the embodiments of the present application will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without inventive exercise.
Fig. 1 is a schematic diagram of a switch dynamics testing system in the prior art.
Fig. 2 is a schematic connection diagram of a switch dynamic characteristic testing system according to an embodiment of the invention.
FIG. 3 is a schematic diagram of a test circuit according to an embodiment of the present invention.
Element number description:
100-a distribution room; 110-high voltage dc power supply; 120-low voltage dc supply; 130-high voltage cable;
140-low voltage cable;
200-a test chamber; 210-a test table; 220-insulating foam board; 230-a glass bin; 240-test circuit;
250-high voltage impedance stabilization network; 260-low voltage impedance stabilization network; 270-fixing the clamp;
280-temperature control module; 290-a humidity control module;
300-a control room; 310-a signal generator; 320-an oscilloscope; 330-differential voltage probe;
340-a flexible current probe; 350-radio frequency coaxial cable.
Detailed Description
The following description of the embodiments of the present invention is provided for illustrative purposes, and other advantages and effects of the present invention will become apparent to those skilled in the art from the present disclosure.
Please refer to fig. 2 to 3. It should be understood that the structures, ratios, sizes, and the like shown in the drawings are only used for matching the disclosure of the specification, so as to be understood and read by those skilled in the art, and are not used to limit the conditions that the present invention can be implemented, so that the present invention has no technical significance, and any structural modification, ratio relationship change or size adjustment should still fall within the scope of the present invention without affecting the efficacy and the achievable purpose of the present invention. In addition, the terms "upper", "lower", "left", "right", "middle" and "one" used in the present specification are for clarity of description, and are not intended to limit the scope of the present invention, and the relative relationship between the terms and the terms is not to be construed as a scope of the present invention.
Referring to fig. 2, the present invention discloses a system for testing the switching dynamic characteristics of an inverter, which is used for testing the switching dynamic characteristics of a high-power silicon carbide inverter, and includes a distribution room 100, a test room 200, and a control room 300, wherein the distribution room 100, the test room 200, and the control room 300 in this embodiment all use shielding rooms in order to reduce the influence of the test environment on the test result.
A high voltage dc power supply 110 and a low voltage dc power supply 120 are provided in the electric distribution room 100.
The test chamber 200 is provided with a test table 210, an insulating foam board 220, a glass bin 230, a test circuit 240, a high voltage impedance stabilizing network 250, a low voltage impedance stabilizing network 260 and a fixing clamp 270.
Specifically, an insulating foam board 220 is laid on the test table 210, a glass bin 230 with an open bottom is arranged on the insulating foam board 220, the edge of the glass bin 230, which is in contact with the insulating foam board 220, is sealed by plastic, and a movable door is further arranged on the glass bin 230 and used for placing or taking out the inverter to be tested. The glass silo 230 provides a closed, reliable test environment for the switch dynamics test system.
Referring to fig. 2 and 3, the test circuit 240 is disposed in the glass bin 230 and is used for testing the inverter to be tested, the high voltage dc power supply 110 is connected to the test circuit 240 through the high voltage cable 130 to provide the test circuit 240 with high voltage dc voltage required for testing, and the low voltage dc power supply 120 is connected to the test circuit 240 through the low voltage cable 140 to provide the test circuit 240 with low voltage dc voltage required for testing. In order to reduce interference, the high-voltage cable 130 and the low-voltage cable 140 of the present embodiment both use shielding cables.
Among them, the test circuit 240 includes:
and the support capacitor is connected between the input ends of the high-voltage power supplies of the inverter to be tested in series and used for stabilizing the input positive and negative high voltages.
And the first controllable switch is connected between one end of the support capacitor and the external high-voltage direct-current power supply 110 in series and used for connecting or disconnecting the high-voltage power supply loop. In this embodiment, the first controllable switch is connected in series in the positive pole loop of the high voltage power supply, and in a possible embodiment, the first controllable switch may also be disposed in the negative pole loop of the high voltage power supply. The first controllable switch switches on or off the high-voltage circuit according to an external control signal.
And the voltmeter is connected with the supporting capacitor in parallel and used for detecting the voltage values at the two ends of the supporting capacitor after the first controllable switch is disconnected.
And the discharge unit is connected between one end of the support capacitor connected with the positive electrode of the high-voltage power supply and the power ground in series and is used for discharging the charges accumulated by the support capacitor to the power ground after the test is finished and the first controllable switch is switched off. The discharge unit comprises a discharge resistor and a second controllable switch, one end of the discharge resistor is connected with the support capacitor, the other end of the discharge resistor is connected with the second controllable switch, the other end of the second controllable switch is connected with a power ground, and the second controllable switch is connected with or disconnected with a discharge loop according to an external control signal. During testing, the voltage and the electric charge quantity accumulated by the supporting capacitor can be checked in real time according to the display numerical value of the voltmeter, and when the voltage or the electric charge quantity accumulated by the supporting capacitor exceeds a set value, the discharge unit is started for testing the safety of equipment and testing personnel, and the electric charge accumulated by the supporting capacitor is discharged to a power ground.
The variable load is connected between the load ends of the inverter to be tested in series and used for adjusting the load of the inverter to be tested so as to enable the inverter to be tested to achieve the working condition of specified output current. The variable load comprises a plurality of load units which are connected in parallel, each load unit comprises an air reactor and a third controllable switch which are connected in series, each air reactor is a high-power air reactor, and the reactance value can be set to different gears according to test requirements. During testing, the third controllable switch switches on or off the load loop according to an external control signal, and shifts gears to meet different testing working condition requirements. In the embodiment, the power and the reactance value of the air reactor are designed, so that the instantaneous current borne by the variable load can reach more than 1000A, and the inductance value range is 10 mu H-500 mu H.
Further, in order to avoid that the parasitic resistance, parasitic inductance and parasitic capacitance introduced by the test system are too large to affect the accuracy of the test result of the dynamic characteristics of the switch and cannot accurately reflect the switching characteristics of the silicon carbide inverter, the test circuit 240 adopts a copper bar made of a high conductivity material and wide and short to realize the electrical connection of a high-voltage loop, the high-voltage direct-current power supply 110 is connected to the high-voltage power supply input end of the inverter to be tested through the copper bar, and the support capacitor, the first controllable switch, the voltmeter, the discharge resistor and the high-voltage power supply input end of the inverter to be tested are respectively connected to the copper bar and connected to the high-voltage direct-current power supply 110; meanwhile, the variable load is also electrically connected with the load end of the inverter to be tested through the copper bar. The copper bar adopted by the method is made of a high-conductivity material, and the size of the copper bar is as wide and short as possible.
The fixing clamp 270 is fixedly disposed on the insulating foam board 220, and the number of the fixing clamps 270 may be multiple, and in this embodiment, the fixing clamp 270 includes 270a, 270b, and 270 c; the fixing jig 270a is used to fix the test circuit 240. Each electrical component of the test circuit 240 may be fixed to a plastic base by a plastic bolt having a low dielectric constant, and the plastic base is fixed to the fixing jig 270; and the fixing clamp 270 and the plastic base are both made of insulating materials with low dielectric constants, so that parasitic resistance and parasitic inductance values introduced during circuit connection are smaller, parasitic capacitance introduced during circuit fixing is smaller, and a test result can more accurately reflect the actual switching characteristics of the silicon carbide inverter.
Further, at a normal temperature of 25 ℃, the relative dielectric constant of the insulating material of the plastic bolt and the fixing clamp 270 should be less than 2, the relative dielectric constant of the insulating material of the plastic base should be less than 3, the material conductivity of the copper bar should be greater than 56.0MS/m, and the surface should be subjected to anti-oxidation treatment, such as gold plating.
A high voltage impedance stabilizing network 250 connected in series between the high voltage dc power supply 110 and the high voltage input terminal of the test circuit 240; and the low-voltage impedance stabilizing network 260 is connected in series between the high-voltage direct current power supply 110 and the low-voltage input end of the test circuit 240. By adopting the scheme, external interference current can be isolated, the input and output impedance of the test circuit is stabilized, and the test result is kept consistent when different test sites and different arrangements are ensured. It should be understood that the impedance stabilization network can provide a specified load impedance for measuring the interference voltage of the sample in the radio frequency range, and simultaneously isolate the sample from the power supply.
Continuing, glass silo 230 is provided with:
the temperature control module 280 includes a plurality of temperature sensors for detecting temperature data in the glass bin and a temperature execution unit for adjusting the temperature in the glass bin according to the temperature data, wherein the temperature execution unit may adopt an existing temperature adjustment device, such as an air conditioner.
The humidity control module 290 includes a plurality of humidity sensors for detecting humidity data in the glass chamber and a plurality of humidity execution units for adjusting the humidity in the glass chamber according to the humidity data, wherein the humidity execution units may adopt existing humidity adjustment devices, such as a humidifier and a dehumidifier.
By adopting the scheme, a closed and reliable test environment bin can be formed in the glass bin, and the switching waveforms of the silicon carbide inverter under different environmental temperatures and humidities can be simulated by adjusting the temperature control module 280 and the humidity control module 290.
To continue the description, the control room 300 is provided with:
a signal generator 310 for outputting a test signal to the inverter to be tested; in this embodiment, the signal generator 310 is configured with a radio frequency coaxial cable 350, and the signal generator 310 is connected to the test circuit 240 through the radio frequency coaxial cable 350.
The oscilloscope 320 is used for displaying the test result of the inverter to be tested; in this embodiment, the oscilloscope 320 is configured with a differential voltage probe 330 and a flexible current probe 340, and the oscilloscope 320 is connected to the test circuit 240 through the differential voltage probe 330 and/or the flexible current probe 340.
Accordingly, the fixing clamp 270b and the fixing clamp 270c are used for clamping the fixed rf coaxial cable 350 and the differential voltage probe 330, and the flexible current probe 340, respectively.
Specifically, in one possible embodiment, the voltage of the high voltage dc power supply 110 is set to 800V; the voltage of the low voltage dc power supply 120 is 13V; the capacitance value of the support capacitor is set to 500 muF; the variable load is provided with 3 gears, and the corresponding inductance values are 50 muH, 100 muH and 200 muH respectively; the resistance value of the discharge resistor is 1000 omega; the high-voltage cable 130 and the low-voltage cable 140 are both shielded cables, and the length of the cables is 1 meter; the insulating bolt and fixing clamp 270 is made of polypropylene material with a relative dielectric constant of 1.5; the plastic base is made of polymethyl methacrylate material with the relative dielectric constant of 2.8; the copper bar material is brass, the conductivity of the copper bar material is 58.0MS/m, and the surface of the copper bar material is plated with gold.
During testing, the inverter to be tested is installed on the fixing clamp 270a, and at the moment, the first controllable switch is in a normally open state; the second controllable switch is in a normally closed state; the temperature of the glass silo 230 was set to 25 ℃ and the relative humidity was set to 30%.
Connecting a low-voltage direct-current power supply 120 to the low-voltage power supply input end of the inverter to be tested; connecting a high-voltage direct-current power supply 110 to a high-voltage power supply input end of an inverter to be tested; accessing the radio frequency coaxial cable 350 to the fixture 270 b; the differential voltage probe 330, the flexible current probe 340 are accessed to the fixture 270 c.
The oscilloscope 320 and the signal generator 310 are started, and the high-voltage direct-current power supply 110 and the low-voltage direct-current power supply 120 are started.
The signal generator 310 outputs four paths of signals according to the setting, wherein the first path of signals is-8V direct current voltage, and controls an upper bridge arm of a switching device of the inverter to be tested to keep a turn-off state; the second path of signal is double-pulse voltage with the amplitude of +15V/-8V, the duty ratio of 10% and the period of 100 mu s, and controls the lower bridge arm of the switching device of the inverter to be tested to be switched on and off temporarily so as to carry out switching waveform test; the third signal is a square wave voltage for controlling the gear of the variable load, and the variable load is shifted when the test is started; the fourth signal is a square wave voltage for controlling the first controllable switch and the second controllable switch, and the second controllable switch is controlled to discharge after the test is finished.
After the temperature and humidity in the glass bin 230 are stabilized, the temperature control module 280 and the humidity control module 290 are closed, so that the interference of the electronic devices of the temperature control module 280 and the humidity control module 290 is avoided. At this time, the collector-to-emitter voltage, the gate-to-emitter voltage, and the collector current waveform of the switching device are captured twice by the oscilloscope 320, and the data is saved to obtain the test result.
In summary, the switching dynamic characteristic test circuit and system of the inverter of the present invention have the following effects:
1. the discharge unit is arranged in the test circuit of the inverter to be tested, so that charges accumulated by the support capacitor can be discharged to a power supply ground after the test is finished, and the safety of equipment and personnel is effectively protected;
2. the test circuit is provided with a variable load, and can adapt to various test working conditions by adjusting gears;
3. the test circuit is arranged in the sealed glass bin, and the temperature and the humidity in the glass bin are adjustable, so that a closed and reliable test environment is provided, the test requirements of the temperature and the humidity in different environments can be met, and the limitation of the existing test system is solved;
4. the test power supply is connected to the test circuit through the pair of linear impedance stabilizing networks, so that external interference current can be isolated, the input and output impedance of the test circuit is stabilized, and the test result is kept consistent when different test sites and different arrangements are ensured;
5. the test circuit adopts the copper bar to carry out high-voltage electrical connection and adopts insulating materials to fix, so that the parasitic resistance, parasitic inductance and parasitic capacitance of the access can be greatly reduced, and the test result can more accurately reflect the actual switching characteristic of the silicon carbide inverter.
Therefore, the invention effectively overcomes various defects in the prior art and has high industrial utilization value.
The foregoing embodiments are merely illustrative of the principles and utilities of the present invention and are not intended to limit the invention. Any person skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical spirit of the present invention be covered by the claims of the present invention.
Claims (10)
1. A switching dynamics test circuit for an inverter, comprising:
the support capacitor is connected between the input ends of the high-voltage power supplies of the inverter to be tested in series;
the first controllable switch is connected between one end of the supporting capacitor and an external high-voltage direct-current power supply in series and is switched on or switched off according to an external control signal;
the voltmeter is connected with the supporting capacitor in parallel;
the discharge unit is connected between one end of the support capacitor connected with the positive electrode of the high-voltage direct-current power supply and a power ground in series;
and the variable load is connected between the load ends of the inverter to be tested in series.
2. The switching dynamics test circuit of claim 1, wherein: the bleeder unit comprises a discharge resistor and a second controllable switch;
one end of the discharge resistor is connected with the support capacitor, and the other end of the discharge resistor is connected with the second controllable switch;
the other end of the second controllable switch is connected with a power ground;
the second controllable switch is switched on or off according to an external control signal.
3. The switching dynamics test circuit of claim 1, wherein:
the variable load comprises a plurality of load units connected in parallel with each other;
each of the load units includes an air-core reactor and a third controllable switch connected in series, and the third controllable switch is turned on or off according to an external control signal.
4. The switching dynamics test circuit of claim 1, wherein:
the high-voltage power supply input ends of the supporting capacitor, the first controllable switch, the voltmeter, the discharge unit and the inverter to be tested are respectively and electrically connected with an external high-voltage direct-current power supply through copper bars.
5. The switching dynamics test circuit of claim 1, wherein:
the variable load is electrically connected with the load end of the inverter to be tested through a copper bar.
6. A system for testing switching dynamics of an inverter, comprising:
the power distribution room is internally provided with a high-voltage direct-current power supply and a low-voltage direct-current power supply;
the test chamber is provided with:
a glass bin with an opening at the bottom;
the test circuit is arranged in the glass bin and used for testing the inverter to be tested, wherein the test circuit is the switch dynamic characteristic test circuit of the inverter according to any one of claims 1 to 5;
the high-voltage impedance stabilizing network is connected between the high-voltage direct-current power supply and the high-voltage input end of the test circuit in series;
the low-voltage impedance stabilizing network is connected between the low-voltage direct-current power supply and the low-voltage input end of the test circuit in series;
the control room, be equipped with in the control room:
a signal generator for outputting a test signal to the test circuit;
and the oscilloscope is used for displaying the test result of the inverter to be tested.
7. The switching dynamics testing system of claim 6, wherein:
the distribution room, the test room and the control room all adopt shielding rooms.
8. The switching dynamics testing system of claim 6, further comprising:
a test table;
the insulating foam board set up in on the test table, the glass storehouse set up in on the insulating foam board, just the glass storehouse with the border department of insulating foam board contact passes through plastic seal.
9. The switching dynamics testing system of claim 8, wherein:
the glass bin is provided with a movable door for placing or taking out the inverter to be tested;
and a plurality of fixing clamps are further arranged in the glass bin, and each fixing clamp is fixedly arranged on the insulating foam board and is used for fixing the inverter to be tested, the differential voltage probe and the flexible current probe of the oscilloscope and the radio frequency coaxial cable of the signal generator.
10. The switching dynamics testing system of claim 6, wherein: still be equipped with in the glass storehouse:
the temperature control module comprises a temperature sensor and a temperature execution unit, and the temperature execution unit adjusts the temperature in the glass bin according to temperature data detected by the temperature sensor;
and the humidity control module comprises a humidity sensor and a humidity execution unit, and the humidity execution unit adjusts the humidity in the glass bin according to the humidity data detected by the humidity sensor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202111533971.9A CN114217217A (en) | 2021-12-15 | 2021-12-15 | Switching dynamic characteristic test circuit and system of inverter |
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| CN202111533971.9A CN114217217A (en) | 2021-12-15 | 2021-12-15 | Switching dynamic characteristic test circuit and system of inverter |
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| CN114217217A true CN114217217A (en) | 2022-03-22 |
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| CN202111533971.9A Pending CN114217217A (en) | 2021-12-15 | 2021-12-15 | Switching dynamic characteristic test circuit and system of inverter |
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