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AU3299884A - Electronic gating arrangement - Google Patents

Electronic gating arrangement

Info

Publication number
AU3299884A
AU3299884A AU32998/84A AU3299884A AU3299884A AU 3299884 A AU3299884 A AU 3299884A AU 32998/84 A AU32998/84 A AU 32998/84A AU 3299884 A AU3299884 A AU 3299884A AU 3299884 A AU3299884 A AU 3299884A
Authority
AU
Australia
Prior art keywords
gating arrangement
electronic gating
electronic
arrangement
gating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU32998/84A
Inventor
Michel Camille Auguste Rene Rahier
Daniel Sallaerts
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Standard Electric Corp
Original Assignee
International Standard Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from BE2/60206A external-priority patent/BE897770A/en
Application filed by International Standard Electric Corp filed Critical International Standard Electric Corp
Publication of AU3299884A publication Critical patent/AU3299884A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Logic Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AU32998/84A 1983-09-19 1984-09-13 Electronic gating arrangement Abandoned AU3299884A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
BE2/60206A BE897770A (en) 1983-09-19 1983-09-19 Semiconductor device used in gating network for selective transmission - couples two logic networks to establish given input conditions controlling elements
BE60206 1983-09-19

Publications (1)

Publication Number Publication Date
AU3299884A true AU3299884A (en) 1985-03-28

Family

ID=3865651

Family Applications (1)

Application Number Title Priority Date Filing Date
AU32998/84A Abandoned AU3299884A (en) 1983-09-19 1984-09-13 Electronic gating arrangement

Country Status (4)

Country Link
AU (1) AU3299884A (en)
BR (1) BR8404598A (en)
ES (1) ES8603112A1 (en)
GB (1) GB2153090B (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3633100A (en) * 1970-05-12 1972-01-04 Ibm Testing of nonlinear circuits by comparison with a reference simulation with means to eliminate errors caused by critical race conditions
GB1336296A (en) * 1970-12-02 1973-11-07 Molekularelektronik Integrated circuit arrangments
US3882386A (en) * 1971-06-09 1975-05-06 Honeywell Inf Systems Device for testing operation of integrated circuital units
US3784910A (en) * 1972-07-13 1974-01-08 Teradyne Inc Sequential addressing network testing system

Also Published As

Publication number Publication date
GB2153090A (en) 1985-08-14
BR8404598A (en) 1985-08-06
GB8423521D0 (en) 1984-10-24
ES536075A0 (en) 1985-11-01
GB2153090B (en) 1987-10-14
ES8603112A1 (en) 1985-11-01

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