[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Waizman, 2003 - Google Patents

CPU power supply impedance profile measurement using FFT and clock gating

Waizman, 2003

Document ID
3782438439029365382
Author
Waizman A
Publication year
Publication venue
Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)

External Links

Snippet

CPU power supply impedance profile measurement using FFT and clock gating Page 1 CPU Power Supply Impedance Profile Measurement Using FFT and Clock Gating Alex Wahman, (email: alexw@iil.intel.com), (Phone: 97248656923) (Fax: 97248654999) Intel Corporation …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/133—Arrangements for measuring electric power or power factor by using digital technique
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F1/00—Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • G06F1/08—Clock generators with changeable or programmable clock frequency

Similar Documents

Publication Publication Date Title
Waizman CPU power supply impedance profile measurement using FFT and clock gating
TWI221909B (en) System and method of measuring low impedances
Gnad et al. An experimental evaluation and analysis of transient voltage fluctuations in FPGAs
Waizman et al. Integrated power supply frequency domain impedance meter (IFDIM)
US20120049947A1 (en) Method and device for measuring integrated circuit power supply noise and calibration of power supply noise analysis models
US7681099B2 (en) Techniques for integrated circuit clock signal manipulation to facilitate functional and speed test
US7138815B1 (en) Power distribution system built-in self test using on-chip data converter
US6911827B2 (en) System and method of measuring low impedances
US7203608B1 (en) Impedane measurement of chip, package, and board power supply system using pseudo impulse response
Peetermans et al. Characterization of oscillator phase noise arising from multiple sources for ASIC true random number generation
Oliver et al. Power estimations vs. power measurements in Cyclone III devices
Xia et al. On-chip jitter measurement for phase locked loops
Kantorovich et al. Measurement of low impedance on chip power supply loop
Kantorovich et al. Measurement of milliohms of impedance at hundred MHz on chip power supply loop
Vold et al. Effects of slow motion on deuteron relaxation time anisotropy
Baudry et al. Overview of emission and susceptibility investigation and modeling with near-field measurements
Nakutis A current consumption measurement approach for FPGA-based embedded systems
Uematsu et al. Impulse response of on-chip power supply networks under varying conditions
Lambert et al. Estimation of microprocessor instantaneous load current
Lokesh et al. DESIGN OF HIGH PERFORMANCE PULSE GENERATOR TO PERFORM AUTOMATIC TEST IN VLSI CIRCUITS.
Taylor et al. Transient response testing of nonlinear analogue circuits using optimised fault sets
Zhou et al. A method to measure impedance of chip/package/board power supply system using pseudo-impulse current
Ihlenfeld Digital Sampling Techniques for AC Josephson Standards at NRC-Canada
Wang et al. The pulse sequence generator based on CPLD in the application of pulse nuclear magnetic resonance system
Stockton On improved methods for timing the digitisation of AC waveforms