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Lin et al., 2019 - Google Patents

Critical impact of gate dielectric interfaces on the trap states and cumulative charge of high-performance organic thin field transistors

Lin et al., 2019

Document ID
2785979239530209270
Author
Lin H
Zhao W
Kong X
Li L
Li Y
Kuang P
Zhang Y
Zhang L
Sun M
Tao S
Publication year
Publication venue
Materials Science in Semiconductor Processing

External Links

Snippet

In the operation of OFETs, the electrical properties are strongly dependent on the merits of the constituting layers and the formed interfaces. Here we study the trap states variations at the interface between the organic semiconductor pentacene and polymer insulators. With …
Continue reading at www.sciencedirect.com (other versions)

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