Gunti et al., 2024 - Google Patents
Enhanced dielectric constant of PVDF-HFP/BFO composite films for ferroelectric applicationsGunti et al., 2024
- Document ID
- 2005183745732662917
- Author
- Gunti H
- Puli V
- Simhachalam N
- Publication year
- Publication venue
- ECS Journal of Solid State Science and Technology
External Links
Snippet
We have developed multiferroic Bismuth ferrite (BiFeO 3, BFO) incorporated Poly (vinylidene fluoride-co-hexafluoropropylene)(PVDF-HFP) polymer-ceramic composites through the solution casting method. The polymer-ceramic composites are fabricated by varying the …
- 229920005569 poly(vinylidene fluoride-co-hexafluoropropylene) 0 title abstract description 54
Classifications
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- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L41/00—Piezo-electric devices in general; Electrostrictive devices in general; Magnetostrictive devices in general; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L41/16—Selection of materials
- H01L41/18—Selection of materials for piezo-electric or electrostrictive devices, e.g. bulk piezo-electric crystals
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/70—Crystal-structural characteristics defined by measured X-ray, neutron or electron diffraction data
- C01P2002/72—Crystal-structural characteristics defined by measured X-ray, neutron or electron diffraction data by d-values or two theta-values, e.g. as X-ray diagram
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/80—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70
- C01P2002/85—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70 by XPS, EDX or EDAX data
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