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Asenov et al., 2022 - Google Patents

TCAD modeling of bulk radiation damage effects in silicon devices with the Perugia radiation damage model

Asenov et al., 2022

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Document ID
17800068868501147445
Author
Asenov P
Arcidiacono R
Cartiglia N
Croci T
Ferrero M
Fondacci A
Morozzi A
Moscatelli F
Passeri D
Sola V
Publication year
Publication venue
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

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Abstract The “Perugia Surface and Bulk” radiation damage model is a Synopsys Sentaurus Technology CAD (TCAD) numerical model which accounts for surface and bulk damage effects induced by radiation on silicon particle detectors. In this work, the significance of the …
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