[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Czajkowski et al., 2017 - Google Patents

Durable and cost-effective neutral density filters utilizing multiple reflections in glass slide stacks

Czajkowski et al., 2017

View PDF
Document ID
16448231503583209079
Author
Czajkowski K
Schmid M
Publication year
Publication venue
IEEE Photonics Journal

External Links

Snippet

We propose an application of a stack of glass slides as a broadband neutral density filter with high (> 100 W/cm 2) damage threshold. The influence of multiple reflections on the filter transmittance is analyzed with transfer matrix method. The numerical study proves that the …
Continue reading at ieeexplore.ieee.org (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colour
    • G01J3/28—Investigating the spectrum
    • G01J3/447—Polarisation spectrometry
    • G—PHYSICS
    • G02—OPTICS
    • G02F—DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B6/00—Light guides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/02—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material of coating

Similar Documents

Publication Publication Date Title
Niu et al. Influence of Surface Morphology on Absorptivity of Light‐Absorbing Materials
Hawranek et al. The control of errors in ir spectrophotometry—III. Transmission measurements using thin cells
El-Zaiat Determination of the complex refractive index of a thick slab material from its spectral reflectance and transmittance at normal incidence
CN102243065A (en) Back compensation-based transparent substrate film thickness measurement system
Paul et al. Anomalous refraction, diffraction, and imaging in metamaterials
Renhorn et al. Four-parameter model for polarization-resolved rough-surface BRDF
Czajkowski et al. Durable and cost-effective neutral density filters utilizing multiple reflections in glass slide stacks
Le Bohec et al. Relationship between topographic parameters and BRDF for tungsten surfaces in the visible spectrum
Zavislan Angular scattering from optical interference coatings: scalar scattering predictions and measurements
JP7147657B2 (en) Broadband pulse light source device, spectroscopic measurement device and spectroscopic measurement method
George et al. An improved wire grid polarizer for thermal infrared applications
Gonzalez et al. Bi-directional scatter and single-surface reflectivity of random anti-reflective nanostructured surfaces
Gu et al. Enhanced backscattering from a rough dielectric film on a glass substrate
Wang et al. Research on grating surface microstructure for the chromatic aberration compensation in infrared band
Schulz et al. Neutron energy analysis by silicon prisms
Wilson et al. Long-duration CW laser testing of optical windows with random antireflective surface structures on both interfaces: preliminary results
Ding et al. Brewster’s angle method for absorption coefficient measurement of high-resistivity silicon based on CW THz laser
George et al. Nanowire grid polarizers for mid-and long-wavelength infrared applications
Valyukh et al. Simulation of light scattering from exoskeletons of scarab beetles
Pavlyuchenko et al. Investigation of the level of uncertainty given by Brillouin light scattering
Tan et al. T wo‐dimensional spectrum detection based on the imperfect virtually imaged phased array
Fu et al. Device scaling effect on the spectral-directional absorptance of wafer’s front side
Gonzalez Jr Surface Scatter of Antireflective Nanostructured Dielectric Interfaces
Al Sadab et al. Fresnel coefficients of quartz glass using a linearly polarized diode laser
Causa et al. FTU diagnostic system based on THz Time-Domain Spectroscopy