Sternberg et al., 2006 - Google Patents
Single-event sensitivity and hardening of a pipelined analog-to-digital converterSternberg et al., 2006
- Document ID
- 9155008137946665984
- Author
- Sternberg A
- Massengill L
- Hale M
- Blalock B
- Publication year
- Publication venue
- IEEE transactions on nuclear science
External Links
Snippet
Circuit simulations are used to determine the response of a pipelined analog-to-digital converter (ADC) to radiation-induced single-event transients. The ADC uses a cascade of 9 stages which each resolve 1.5 bits. Digital error correction is used to reassemble the bits …
- 230000035945 sensitivity 0 title description 11
Classifications
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
- H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
- H03M1/361—Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/40—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type
- H03M1/403—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type using switched capacitors
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
- H03M1/0678—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
- H03M1/068—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS
- H03M1/0682—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS using a differential network structure, i.e. symmetrical with respect to ground
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
- H03M1/069—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy by range overlap between successive stages or steps
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
- H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
- H03M1/164—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0614—Continuously compensating for, or preventing, undesired influence of physical parameters of harmonic distortion
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/74—Simultaneous conversion
- H03M1/80—Simultaneous conversion using weighted impedances
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Xu et al. | A 78.5-dB SNDR radiation-and metastability-tolerant two-step split SAR ADC operating up to 75 MS/s with 24.9-mW power consumption in 65-nm CMOS | |
Sun | Exploiting process variation and noise in comparators to calibrate interstage gain nonlinearity in pipelined ADCs | |
Sternberg et al. | Single-event sensitivity and hardening of a pipelined analog-to-digital converter | |
Huang et al. | Analysis of nonideal behaviors based on INL/DNL plots for SAR ADCs | |
Nam et al. | An embedded passive gain technique for asynchronous SAR ADC achieving 10.2 ENOB 1.36-mW at 95-MS/s in 65 nm CMOS | |
Gatti et al. | Radiation-hardened techniques for CMOS flash ADC | |
US8860598B2 (en) | Bit error rate timer for a dynamic latch | |
Gonzalez et al. | TID effects on a data acquisition system with design diversity redundancy | |
Gines et al. | Digital non-linearity calibration for ADCs with redundancy using a new LUT approach | |
Venkatram et al. | Detection and correction methods for single event effects in analog to digital converters | |
Kauppila et al. | Single event Simulation methodology for analog/mixed signal design hardening | |
Di Salvo | Design of a 12-bit SAR ADC with digital self-calibration for radiation detectors front-ends | |
Olson et al. | Single-event effect mitigation in switched-capacitor comparator designs | |
Sivakumar et al. | Error detection of data conversion in flash ADC using code width based technique | |
Wang et al. | Digital calibration of capacitor mismatch and gain error in pipelined SAR ADCs | |
Huang et al. | An MCT-based bit-weight extraction technique for embedded SAR ADC testing and calibration | |
Rezapour et al. | Design an improved structure for 10-bit pipeline analog to digital converter based on 0.18 µm CMOS technology | |
Kaur et al. | Fast digital foreground gain error calibration for pipelined ADC | |
Shi et al. | Analysis of bitwise and samplewise switched passive charge sharing SAR ADCs | |
Rony et al. | A system-level modeling approach for simulating radiation effects in successive-approximation analog-to-digital converters | |
Joshi et al. | Reduced switching mode for SAR ADCs: analysis and design of SAR A‐to‐D algorithm with periodic standby mode circuit components | |
Türker et al. | Analysis of SAR ADC Performance Under Radiation Exposure | |
Lee et al. | Successive Approximation Register TDC in Time-Mode Signal Processing | |
Askari et al. | Scalable mean voting mechanism for fault tolerant analog circuits | |
Lee et al. | Single-bin DFT-based digital calibration technique for CDAC in SAR ADCs |