Rahman et al., 2012 - Google Patents
Reduction of switching current density in perpendicular magnetic tunnel junctions by tuning the anisotropy of the CoFeB free layerRahman et al., 2012
- Document ID
- 784215568550612008
- Author
- Rahman M
- Lyle A
- Khalili Amiri P
- Harms J
- Glass B
- Zhao H
- Rowlands G
- Katine J
- Langer J
- Krivorotov I
- Wang K
- Wang J
- Publication year
- Publication venue
- Journal of Applied Physics
External Links
Snippet
The spin torque switching behavior of perpendicular magnetic tunnel junctions consisting of a CoFeB free layer and a CoFeB/Ru/(Co/Pd) n exchanged coupled fixed layer is investigated. At first, the Ru and CoFeB layer thickness is tuned in the CoFeB/Ru/(Co/Pd) n …
- 229910019236 CoFeB 0 title abstract description 54
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L43/00—Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
- H01L43/08—Magnetic-field-controlled resistors
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L43/00—Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
- H01L43/02—Details
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L43/00—Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
- H01L43/10—Selection of materials
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/3227—Exchange coupling via one or more magnetisable ultrathin or granular films
- H01F10/3231—Exchange coupling via one or more magnetisable ultrathin or granular films via a non-magnetic spacer
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L43/00—Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
- H01L43/12—Processes or apparatus peculiar to the manufacture or treatment of these devices or of parts thereof
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Khalili Amiri et al. | Switching current reduction using perpendicular anisotropy in CoFeB–MgO magnetic tunnel junctions | |
Rahman et al. | Reduction of switching current density in perpendicular magnetic tunnel junctions by tuning the anisotropy of the CoFeB free layer | |
Nakayama et al. | Spin transfer switching in TbCoFe∕ CoFeB∕ MgO∕ CoFeB∕ TbCoFe magnetic tunnel junctions with perpendicular magnetic anisotropy | |
Ma et al. | Magnetoresistance effect in L1-MnGa/MgO/CoFeB perpendicular magnetic tunnel junctions with Co interlayer | |
Sbiaa et al. | Reduction of switching current by spin transfer torque effect in perpendicular anisotropy magnetoresistive devices | |
Yakata et al. | Influence of perpendicular magnetic anisotropy on spin-transfer switching current in CoFeB∕ MgO∕ CoFeB magnetic tunnel junctions | |
Meng et al. | Annealing effects on CoFeB-MgO magnetic tunnel junctions with perpendicular anisotropy | |
Huai et al. | High performance perpendicular magnetic tunnel junction with Co/Ir interfacial anisotropy for embedded and standalone STT-MRAM applications | |
Lee et al. | Perpendicular magnetization of CoFeB on single-crystal MgO | |
Naik et al. | Thick CoFeB with perpendicular magnetic anisotropy in CoFeB-MgO based magnetic tunnel junction | |
Natarajarathinam et al. | Influence of capping layers on CoFeB anisotropy and damping | |
Sbiaa et al. | Spin transfer torque switching for multi-bit per cell magnetic memory with perpendicular anisotropy | |
Ma et al. | Effect of Mg interlayer on perpendicular magnetic anisotropy of CoFeB films in MgO/Mg/CoFeB/Ta structure | |
Chen et al. | Field-free spin-orbit torque switching of composite perpendicular CoFeB/Gd/CoFeB layers utilized for three-terminal magnetic tunnel junctions | |
Sun et al. | Size dependence of spin-torque induced magnetic switching in CoFeB-based perpendicular magnetization tunnel junctions | |
Chen et al. | Interfacial effect on the ferromagnetic damping of CoFeB thin films with different under-layers | |
Natarajarathinam et al. | Perpendicular magnetic tunnel junctions based on thin CoFeB free layer and Co-based multilayer synthetic antiferromagnet pinned layers | |
Rahman et al. | High temperature annealing stability of magnetic properties in MgO-based perpendicular magnetic tunnel junction stacks with CoFeB polarizing layer | |
Liu et al. | [Co/Ni]-CoFeB hybrid free layer stack materials for high density magnetic random access memory applications | |
Meng et al. | Annealing temperature window for tunneling magnetoresistance and spin torque switching in CoFeB/MgO/CoFeB perpendicular magnetic tunnel junctions | |
Fang et al. | Tunnel magnetoresistance in thermally robust Mo/CoFeB/MgO tunnel junction with perpendicular magnetic anisotropy | |
Ishikawa et al. | Co/Pt multilayer-based magnetic tunnel junctions with a CoFeB/Ta insertion layer | |
Cuchet et al. | Influence of magnetic electrodes thicknesses on the transport properties of magnetic tunnel junctions with perpendicular anisotropy | |
Cuchet et al. | Perpendicular magnetic tunnel junctions with double barrier and single or synthetic antiferromagnetic storage layer | |
Moriyama et al. | Tunnel magnetoresistance and spin torque switching in MgO-based magnetic tunnel junctions with a Co/Ni multilayer electrode |