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2 Results for: Keyword: compact test vector construction
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- ArticleDecember 2000
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers
The use of analog VLSI technology on ordinary but complex electronic products has in the test one of its last frontiers. The design for testability paradigm should allow the test plan implementation early in the design cycle. However, in a successful ...
- ArticleSeptember 2000
Fault Models and Compact Test Vectors for MOS OpAmp circuits
Analog VLSI technology processes are reaching matureness; nevertheless, there is a big constraint, regarding their use on complex electronic products: "the test". The "Design for Testability" paradigms were developed to permit the test plan ...