Paper:
Determination of Aspect Ratio Limitations, Accuracy and Repeatability of a Laser Line Scanning CMM Probe
Bart Boeckmans*, Min Zhang*,**, Frank Welkenhuyzen*, and Jean-Pierre Kruth*
*Department Mechanical Engineering, Division Production Engineering, Machine Design and Automation, KU Leuven
Celestijnenlaan 300, B-3001 Leuven, Belgium
**Beijing Engineering Research Center of Precision Measurement Technology and Instruments,
Beijing University of Technology (BJUT)
Beijing 100124, China
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