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Paper
16 June 1995 Multivariate morphological granulometric texture classification using Walsh and wavelet features
Sinan Batman, Edward R. Dougherty, Mark C. Rzadca, Joseph O. Chapa
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Abstract
As introduced by Matheron, granulometries depend on a single sizing parameter for each structuring element forming the filter. The size distributions resulting from these granulometries have been used successfully to classify texture by using as features the moments of the normalized size distribution. The present paper extends the concept of granulometry in such a way that each structuring element has its own sizing parameter and the resulting size distribution is multivariate. Classification is accomplished by taking either the Walsh or wavelet transform of the multivariate size distribution, obtaining a reduced feature set by applying the Karhunen-Loeve transform to decorrelate the Walsh or wavelet features, and classifying the textures via a Gaussian maximum-likelihood classifier.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sinan Batman, Edward R. Dougherty, Mark C. Rzadca, and Joseph O. Chapa "Multivariate morphological granulometric texture classification using Walsh and wavelet features", Proc. SPIE 2488, Visual Information Processing IV, (16 June 1995); https://doi.org/10.1117/12.212011
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Wavelets

Image classification

Signal processing

Wavelet transforms

Binary data

Image processing

Signal to noise ratio

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