ox circuits.">ox circuits., dblp, computer science, bibliography, knowledge graph, author, editor, publication, conference, journal, book, thesis, database, collection, open data, bibtex">

More Web Proxy on the site http://driver.im/

default search action

combined dblp search
author search
venue search
publication search

ask others

"Gate oxide leakage and delay tradeoffs for dual-T_ox circuits."

Anup Kumar Sultania, Dennis Sylvester, Sachin S. Sapatnekar (2005)

> Home

Details and statistics

DOI: 10.1109/TVLSI.2005.862723

access: closed

type: Journal Article

metadata version: 2021-07-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tvlsi/SultaniaSS05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/SultaniaSS05
Anup Kumar Sultania, Dennis Sylvester, Sachin S. Sapatnekar:
Gate oxide leakage and delay tradeoffs for dual-T_ox circuits. IEEE Trans. Very Large Scale Integr. Syst. 13(12): 1362-1375 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.