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"Scalable analytical model for reliability measures in aging VLSI by ..."

Davide Cerotti et al. (2019)

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DOI: 10.1016/J.PEVA.2019.01.001

access: closed

type: Journal Article

metadata version: 2024-08-04

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Davide Cerotti, Antonio Miele, Marco Gribaudo, Andrea Bobbio, Cristiana Bolchini:
Scalable analytical model for reliability measures in aging VLSI by interacting Markovian agents. Perform. Evaluation 132: 21-37 (2019)

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