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"A Novel Out-of-Control Action Plan (OCAP) for Optimizing Efficiency and ..."

Woonyoung Yeo et al. (2024)

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DOI: 10.3390/S24165116

access: open

type: Journal Article

metadata version: 2024-10-03

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Woonyoung Yeo, Yung-Chia Chang, Liang-Ching Chen, Kuei-Hu Chang:
A Novel Out-of-Control Action Plan (OCAP) for Optimizing Efficiency and Quality in the Wafer Probing Process for Semiconductor Manufacturing. Sensors 24(16): 5116 (2024)

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