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"Total-ionizing-dose effects and reliability of carbon nanotube FET devices."

Cher Xuan Zhang et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.05.011

access: closed

type: Journal Article

metadata version: 2024-10-06

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  - https://dblp.org/rec/journals/mr/ZhangZFASRG14
Cher Xuan Zhang, En-xia Zhang, Daniel M. Fleetwood, Michael L. Alles, Ronald D. Schrimpf, Chris Rutherglen, Kosmas Galatsis:
Total-ionizing-dose effects and reliability of carbon nanotube FET devices. Microelectron. Reliab. 54(11): 2355-2359 (2014)

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