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"A review of recent MOSFET threshold voltage extraction methods."

Adelmo Ortiz-Conde et al. (2002)

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DOI: 10.1016/S0026-2714(02)00027-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mr/Ortiz-CondeSLCEY02
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Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue:
A review of recent MOSFET threshold voltage extraction methods. Microelectron. Reliab. 42(4-5): 583-596 (2002)

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