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"Conducted EMI evolution of power SiC MOSFET in a Buck converter after ..."

Shawki Douzi et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.092

access: closed

type: Journal Article

metadata version: 2020-02-22

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Shawki Douzi, Moncef Kadi, Habib Boulzazen, Mohamed Tlig, Jaleleddine Ben Hadj Slama:
Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests. Microelectron. Reliab. 88-90: 219-224 (2018)

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