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"Single event transient effects in a voltage reference."

P. C. Adell et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.05.029

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/AdellSCHZBM05
P. C. Adell, Ronald D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, Hugh J. Barnaby, O. Mion:
Single event transient effects in a voltage reference. Microelectron. Reliab. 45(2): 355-359 (2005)

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