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"Process variability-induced NoC link failure: A probabilistic model."

Eman Kamel Gawish, M. Watheq El-Kharashi, Mohamed Fathy Abu-ElYazeed (2015)

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DOI: 10.1016/J.MEJO.2015.01.004

access: closed

type: Journal Article

metadata version: 2024-04-20

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Eman Kamel Gawish, M. Watheq El-Kharashi, Mohamed Fathy Abu-ElYazeed:
Process variability-induced NoC link failure: A probabilistic model. Microelectron. J. 46(3): 248-257 (2015)

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