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"CMOS transistor faults and bridging faults: Testability by delay effects ..."

Uwe Hübner, Wolfgang Meyer, Heinrich Theodor Vierhaus (1992)

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DOI: 10.1016/0165-6074(92)90342-5

access: closed

type: Journal Article

metadata version: 2020-05-19

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Uwe Hübner, Wolfgang Meyer, Heinrich Theodor Vierhaus:
CMOS transistor faults and bridging faults: Testability by delay effects and overcurrents. Microprocess. Microprogramming 35(1-5): 377-382 (1992)

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