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"Toward Evaluating the Reliability of Deep-Neural-Network-Based IoT Devices."

Mingyuan Fan et al. (2022)

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DOI: 10.1109/JIOT.2021.3138969

access: closed

type: Journal Article

metadata version: 2024-08-26

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  - journals/iotj/FanLCYGWL22
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  - https://dblp.org/rec/journals/iotj/FanLCYGWL22
Mingyuan Fan, Yang Liu, Cen Chen, Shengxing Yu, Wenzhong Guo, Li Wang, Ximeng Liu:
Toward Evaluating the Reliability of Deep-Neural-Network-Based IoT Devices. IEEE Internet Things J. 9(18): 17002-17013 (2022)

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