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"Machine learning classification algorithm for VLSI test cost reduction."

Tai Song, Zhengfeng Huang, Aibin Yan (2022)

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DOI: 10.1016/J.VLSI.2022.06.005

access: closed

type: Journal Article

metadata version: 2023-08-28

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Tai Song, Zhengfeng Huang, Aibin Yan:
Machine learning classification algorithm for VLSI test cost reduction. Integr. 87: 40-48 (2022)

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