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"Polynomial Identity Testing for Depth 3 Circuits"

Neeraj Kayal, Nitin Saxena (2005)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2022-09-28

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  - electronic edition @ weizmann.ac.il (open access)
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  dblp key:
  - journals/eccc/ECCC-TR05-150
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  persistent URL:
  - https://dblp.org/rec/journals/eccc/ECCC-TR05-150
Neeraj Kayal, Nitin Saxena:
Polynomial Identity Testing for Depth 3 Circuits. Electron. Colloquium Comput. Complex. TR05 (2005)

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