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"Industrial BIST of Embedded RAMs."

Paolo Camurati et al. (1995)

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DOI: 10.1109/MDT.1995.466385

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/CamuratiPRBBM95
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  persistent URL:
  - https://dblp.org/rec/journals/dt/CamuratiPRBBM95
Paolo Camurati, Paolo Prinetto, Matteo Sonza Reorda, Stefano Barbagallo, Andrea Burri, Davide Medina:
Industrial BIST of Embedded RAMs. IEEE Des. Test Comput. 12(3): 86-95 (1995)

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