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"Deterministic identity testing paradigms for bounded top-fanin depth-4 ..."

Pranjal Dutta, Prateek Dwivedi, Nitin Saxena (2023)

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DOI: 10.48550/ARXIV.2304.11325

access: open

type: Informal or Other Publication

metadata version: 2023-12-07

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  dblp key:
  - journals/corr/abs-2304-11325
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  - https://dblp.org/rec/journals/corr/abs-2304-11325
Pranjal Dutta, Prateek Dwivedi, Nitin Saxena:
Deterministic identity testing paradigms for bounded top-fanin depth-4 circuits. CoRR abs/2304.11325 (2023)

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