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"Degradation mechanisms and lifetime assessment of Ge Vertical PIN ..."

Kristof Croes et al. (2022)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-20

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  dblp key:
  - conf/ofc/CroesSTRSTFA22
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  persistent URL:
  - https://dblp.org/rec/conf/ofc/CroesSTRSTFA22
Kristof Croes, Veerle Simons, Brecht Truijen, Philippe Roussel, Koen Van Sever, Artemisia Tsiara, Jacopo Franco, Philippe Absil:
Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors. OFC 2022: 1-3

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