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"A Method to Derive Compact Test Sets for Path Delay Faults in ..."

Jayashree Saxena, Dhiraj K. Pradhan (1993)

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DOI: 10.1109/TEST.1993.470630

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/SaxenaP93
Jayashree Saxena, Dhiraj K. Pradhan:
A Method to Derive Compact Test Sets for Path Delay Faults in Combinational Circuits. ITC 1993: 724-733

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