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"LESER-2: Detailed Consideration in Latch Design under Process Migration ..."

Alan S.-M. Liu et al. (2024)

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DOI: 10.1109/ITC51657.2024.00063

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Alan S.-M. Liu, Lowry P.-T. Wang, Charles H.-P. Wen, Herming Chiueh:
LESER-2: Detailed Consideration in Latch Design under Process Migration for Prevention of Single-Event Double-Node Upsets. ITC 2024: 407-416

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