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"Testing and programming flash memories on assemblies during high volume ..."

Frans G. M. de Jong et al. (2001)

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DOI: 10.1109/TEST.2001.966664

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers:
Testing and programming flash memories on assemblies during high volume production. ITC 2001: 470-479

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