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"Harnessing process variations for optimizing wafer-level probe-test flow."

Ali Ahmadi et al. (2016)

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DOI: 10.1109/TEST.2016.7805835

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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  dblp key:
  - conf/itc/AhmadiXNOPM16
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  - https://dblp.org/rec/conf/itc/AhmadiXNOPM16
Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing process variations for optimizing wafer-level probe-test flow. ITC 2016: 1-8

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