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"Built-in self-test and self-calibration for analog and mixed signal circuits."

Tao Chen, Degang Chen (2019)

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DOI: 10.1109/ITC44170.2019.9000120

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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Tao Chen, Degang Chen:
Built-in self-test and self-calibration for analog and mixed signal circuits. ITC 2019: 1-8

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