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"Next Generation Design For Testability, Debug and Reliability Using Formal ..."

Sebastian Huhn, Rolf Drechsler (2022)

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DOI: 10.1109/ITC50671.2022.00086

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Sebastian Huhn, Rolf Drechsler:
Next Generation Design For Testability, Debug and Reliability Using Formal Techniques. ITC 2022: 609-618

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