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"Static Electromigration Analysis for Signal Interconnects."

Chanhee Oh et al. (2003)

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DOI: 10.1109/ISQED.2003.1194762

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/isqed/OhBBZPD03
Chanhee Oh, David T. Blaauw, Murat R. Becer, Vladimir Zolotov, Rajendran Panda, Aurobindo Dasgupta:
Static Electromigration Analysis for Signal Interconnects. ISQED 2003: 377-382

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