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"On-line Fabric-Defects Detection Based on Wavelet Analysis."

Sungshin Kim et al. (2005)

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DOI: 10.1007/11424925_112

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/iccsa/KimBCK05
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Sungshin Kim, Hyeon Bae, Seong-Pyo Cheon, Kwang-Baek Kim:
On-line Fabric-Defects Detection Based on Wavelet Analysis. ICCSA (4) 2005: 1075-1084

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