More Web Proxy on the site http://driver.im/

default search action

combined dblp search
author search
venue search
publication search

ask others

"Voltage-based electromigration immortality check for general multi-branch ..."

Zeyu Sun et al. (2016)

> Home

Details and statistics

DOI: 10.1145/2966986.2967083

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iccad/SunDSKHT16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccad/SunDSKHT16
Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Taeyoung Kim, Xin Huang, Sheldon X.-D. Tan:
Voltage-based electromigration immortality check for general multi-branch interconnects. ICCAD 2016: 113

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.