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"Radiation-Hardened Designs for Soft-Error-Rate Reduction by ..."

Yuwen Dave Lin, Charles H.-P. Wen, Herming Chiueh (2017)

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DOI: 10.1145/3060403.3060442

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Yuwen Dave Lin, Charles H.-P. Wen, Herming Chiueh:
Radiation-Hardened Designs for Soft-Error-Rate Reduction by Delay-Adjustable D-Flip-Flops. ACM Great Lakes Symposium on VLSI 2017: 197-202

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