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"Reliable Logic Circuits with Byte Error Control Codes: A Feasibility Study."

Jien-Chung Lo, Masato Kitakami, Eiji Fujiwara (1996)

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DOI: 10.1109/DFTVS.1996.572035

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/LoKF96
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  persistent URL:
  - https://dblp.org/rec/conf/dft/LoKF96
Jien-Chung Lo, Masato Kitakami, Eiji Fujiwara:
Reliable Logic Circuits with Byte Error Control Codes: A Feasibility Study. DFT 1996: 286-294

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