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"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI ..."

Cristiana Bolchini et al. (2007)

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type: Editorship

metadata version: 2019-10-16

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Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba:
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. IEEE Computer Society 2007, ISBN 0-7695-2885-6 [contents]

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