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"A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic."

Tomoo Inoue et al. (2010)

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DOI: 10.1109/DELTA.2010.52

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/delta/InoueIYI10
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  persistent URL:
  - https://dblp.org/rec/conf/delta/InoueIYI10
Tomoo Inoue, Nobukazu Izumi, Yuki Yoshikawa, Hideyuki Ichihara:
A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic. DELTA 2010: 345-349

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