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"A Low Power Deterministic Test Pattern Generator for BIST Based on ..."

Bei Cao, Liyi Xiao, Yongsheng Wang (2008)

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DOI: 10.1109/DELTA.2008.65

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/delta/CaoXW08
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  persistent URL:
  - https://dblp.org/rec/conf/delta/CaoXW08
Bei Cao, Liyi Xiao, Yongsheng Wang:
A Low Power Deterministic Test Pattern Generator for BIST Based on Cellular Automata. DELTA 2008: 266-269

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