DDQ testing of deep submicron CMOS ICs.">DDQ testing of deep submicron CMOS ICs., dblp, computer science, bibliography, knowledge graph, author, editor, publication, conference, journal, book, thesis, database, collection, open data, bibtex">

More Web Proxy on the site http://driver.im/

default search action

combined dblp search
author search
venue search
publication search

ask others

"A novel built-in current sensor for IDDQ testing of deep ..."

Stephan P. Athan, David L. Landis, Sami A. Al-Arian (1996)

> Home

Details and statistics

DOI: 10.1109/VTEST.1996.510845

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vts/AthanLA96
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/AthanLA96
Stephan P. Athan, David L. Landis, Sami A. Al-Arian:
A novel built-in current sensor for I_DDQ testing of deep submicron CMOS ICs. VTS 1996: 118-123

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.