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Takayuki Nakatani
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2020 – today
- 2023
- [j4]Shogo Katayama, Takayuki Nakatani, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi:
Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing. IEICE Electron. Express 20(1): 20220470 (2023) - [c17]Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Shuhei Yamamoto, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi:
Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion. ITC 2023: 47-55 - [c16]Kentaroh Katoh, Shuhei Yamamoto, Zheming Zhao, Yujie Zhao, Shogo Katayama, Anna Kuwana, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa:
A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation. ITC-Asia 2023: 1-6 - 2022
- [j3]Yujie Zhao
, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa:
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. J. Electron. Test. 38(1): 21-38 (2022) - [c15]Keno Sato, Takayuki Nakatani, Shogo Katayama, Daisuke Iimori, Gaku Ogihara, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST. ATS 2022: 37-42 - [c14]Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel J. Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa:
Innovative Practices Track: Innovative Analog Circuit Testing Technologies. VTS 2022: 1 - 2021
- [c13]Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Gaku Ogihara, Daisuke Iimori, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
High Precision Measurement of Sub-Nano Ampere Current in ATE Environment. ATS 2021: 139-140 - [c12]Gaku Ogihara, Takayuki Nakatani, Daisuke Iimori, Shogo Katayama, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Jianglin Wei, Kazumi Hatayama, Haruo Kobayashi:
Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production. ICECS 2021: 1-6 - [c11]Shuhei Yamamoto, Yuto Sasaki, Yujie Zhao, Jianglin Wei, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Takayuki Nakatani, Minh Tri Tran, Shogo Katayama, Kazumi Hatayama, Haruo Kobayashi:
Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method. IOLTS 2021: 1-6 - [c10]Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies. ITC 2021: 284-288 - [c9]Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Akemi Hatta, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Yujie Zhao, Minh Tri Tran, Kazumi Hatayama, Haruo Kobayashi:
Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer. ITC 2021: 364-373 - 2020
- [c8]Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei
Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers. ATS 2020: 1-6 - [c7]Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
Accurate Testing of Precision Voltage Reference by DC-AC Conversion. ATS 2020: 1-2
2010 – 2019
- 2019
- [c6]Riho Aoki, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Yuto Sasaki, Kosuke Machida, Takayuki Nakatani, Jianlong Wang, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
Evaluation of Null Method for Operational Amplifier Short-Time Testing. ASICON 2019: 1-4 - [c5]Jiang-Lin Wei
High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm. ASICON 2019: 1-4 - [c4]Yuto Sasaki, Kosuke Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion. ITC-Asia 2019: 1-6 - [c3]Yusuke Asada, Takahiko Shimizu, Yuji Gendai, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jiang-Lin Wei
Innovative Test Practices in Japan. VTS 2019: 1
2000 – 2009
- 2008
- [j2]Yasuyuki Maekawa, Takayuki Nakatani, Yoshiaki Shibagaki, Takeshi Hatsuda:
A Study on Site Diversity Techniques Related to Rain Area Motion Using Ku-Band Satellite Signals. IEICE Trans. Commun. 91-B(6): 1812-1818 (2008) - 2005
- [j1]Akira Kimoto, Takayuki Nakatani, Yu-Ichiro Matsuoka, Katsunori Shida:
Reconstruction of temperature patterns in the cylindrical head model from electrical capacitance tomography. IEEE Trans. Instrum. Meas. 54(6): 2407-2411 (2005)
1990 – 1999
- 1993
- [c2]Shinichi Kimura, Makoto Kimura, Takayuki Nakatani, Masao Sugai:
A New Approach for PLL Characterization on Mixed Signal ATE. ITC 1993: 697-704 - 1992
- [c1]Masao Sugai, Takayuki Nakatani:
AC Dynamic Testing of 20Bit Sigma-Delta Over-Sampling D/A Converter on a Mixed Signal Test System. ITC 1992: 321-327
Coauthor Index
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