default search action
Shichang Zou
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2023
- [j34]Zhongyang Liu
, Yuqiao Xie
A highly stable and low-cost 12T radiation hardened SRAM cell design for aerospace application. Int. J. Circuit Theory Appl. 51(8): 3938-3948 (2023) - [j33]Yuqiao Xie
A novel high-precision single-event transient hardened voltage comparator design. Int. J. Circuit Theory Appl. 51(10): 4864-4878 (2023) - 2022
- [j32]Zhongyang Liu
A High-Performance and Low-Cost Single-Event Multiple-Node-Upsets Resilient Latch Design. IEEE Trans. Very Large Scale Integr. Syst. 30(12): 1867-1877 (2022) - 2020
- [j31]Huilong Zhu, Dawei Bi, Xin Xie, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou:
Substrate effect on radiation-induced charge trapping in buried oxide for partially-depleted SOI NMOSFET. IEICE Electron. Express 17(7): 20200001 (2020) - [j30]Xiaonian Liu, Lihua Dai, Pingliang Li, Shichang Zou:
Electrical performance of 130 nm PD-SOI MOSFET with diamond layout. Microelectron. J. 99: 104428 (2020) - [j29]Wenyi Zhu
A Wide-Range-Supply-Voltage Sense Amplifier Circuit for Embedded Flash Memory. IEEE Trans. Circuits Syst. II Express Briefs 67-II(8): 1454-1458 (2020)
2010 – 2019
- 2019
- [j28]Wenyi Zhu, Jianwei Jiang, Dianpeng Lin, Jun Xiao, Guangjun Yang, Xiaoyun Li, Shichang Zou:
A charge pump system with new regulation and clocking scheme. IEICE Electron. Express 16(4): 20190005 (2019) - [j27]Xin Xie, Huilong Zhu, Mengying Zhang, Dawei Bi, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou:
Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer. IEICE Electron. Express 16(21): 20190454 (2019) - [j26]Zhaozhao Xu
Demonstration of improvement of specific on-resistance versus breakdown voltage tradeoff for low-voltage power LDMOS. Microelectron. J. 88: 29-36 (2019) - [j25]Jianwei Jiang
Quadruple Cross-Coupled Latch-Based 10T and 12T SRAM Bit-Cell Designs for Highly Reliable Terrestrial Applications. IEEE Trans. Circuits Syst. I Regul. Pap. 66-I(3): 967-977 (2019) - [c2]Jianwei Jiang, Dianpeng Lin, Jun Xiao, Shichang Zou:
Soft-Error-Tolerant Ultralow-Leakage 12T SRAM Bitcell Design. ICICDT 2019: 1-2 - 2018
- [j24]Dianpeng Lin, Yiran Xu, Xiaonian Liu, Wenyi Zhu, Lihua Dai, Mengying Zhang, Xiaoyun Li, Xin Xie, Jianwei Jiang, Huilong Zhu, Zhengxuan Zhang, Shichang Zou:
A novel highly reliable and low-power radiation hardened SRAM bit-cell design. IEICE Electron. Express 15(3): 20171129 (2018) - [j23]Zhiyuan Hu, Lihua Dai, Zhengxuan Zhang, Xiaoyun Li, Shichang Zou:
Total dose radiation induced changes of the floating body effects in the partially depleted SOI NMOS with ultrathin gate oxide. IEICE Electron. Express 15(4): 20171236 (2018) - [j22]Dianpeng Lin, Yiran Xu, Xiaoyun Li, Xin Xie, Jianwei Jiang, Jiangchuan Ren, Huilong Zhu, Zhengxuan Zhang, Shichang Zou:
A novel SEU tolerant memory cell for space applications. IEICE Electron. Express 15(17): 20180656 (2018) - [j21]Dianpeng Lin, Yiran Xu, Xiaoyun Li, Xin Xie, Jianwei Jiang, Jiangchuan Ren, Huilong Zhu, Zhengxuan Zhang, Shichang Zou:
A novel self-recoverable and triple nodes upset resilience DICE latch. IEICE Electron. Express 15(19): 20180753 (2018) - [j20]Zhaozhao Xu
Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device. Microelectron. Reliab. 84: 157-162 (2018) - [j19]Yiran Xu
A 280-KBytes Twin-Bit-Cell Embedded NOR Flash Memory With a Novel Sensing Current Protection Enhanced Technique and High-Voltage Generating Systems. IEEE Trans. Circuits Syst. II Express Briefs 65-II(11): 1569-1573 (2018) - 2017
- [j18]Yiran Xu, Wenyi Zhu, Jun Xiao, Guangjun Yang, Jian Hu, Xiaoyun Li, Weiran Kong, Shichang Zou:
Area-efficient charge pump with local boost technique for embedded flash memory. IEICE Electron. Express 14(21): 20170944 (2017) - [j17]Ruofan Dai, Yunlong Zheng, Jun He, Weiran Kong, Shichang Zou:
A duplex current-reused CMOS LNA with complementary derivative superposition technique. Int. J. Circuit Theory Appl. 45(1): 110-119 (2017) - [j16]Xiaonian Liu, Yiran Xu, Xiangquan Fan, Mengxing Liao, Pingliang Li, Shichang Zou:
A macro SPICE model for 2-bits/cell split-gate flash memory cell. Microelectron. J. 63: 75-80 (2017) - [j15]Wenyi Zhu, Binghan Li, Tao Yu, Weiran Kong, Shichang Zou:
Investigation of read disturb in split-gate memory and its feasible solution. Microelectron. Reliab. 68: 51-56 (2017) - [j14]Lei Song, Zhiyuan Hu, Mengying Zhang, Xiaonian Liu, Lihua Dai, Zhengxuan Zhang, Shichang Zou:
Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology. Microelectron. Reliab. 74: 1-8 (2017) - [j13]Lihua Dai
Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs. Microelectron. Reliab. 74: 74-80 (2017) - 2016
- [j12]Yunlong Zheng, Ruofan Dai, Zhuojun Chen, Shulong Sun, Zheng Wang, Zehua Sang, Min Lin, Shichang Zou:
Comparison of single-event transients of T-gate core and IO device in 130 nm partially depleted silicon-on-insulator technology. IEICE Electron. Express 13(12): 20160424 (2016) - [j11]Ruofan Dai, Yunlong Zheng, Jun He, Guojun Liu, Weiran Kong, Shichang Zou:
A 0.5-V novel complementary current-reused CMOS LNA for 2.4 GHz medical application. Microelectron. J. 55: 64-69 (2016) - 2014
- [j10]Shengbo Zhang, Jun Xiao, Guangjun Yang, Jian Hu, Shichang Zou:
A Novel Sourceline Voltage Compensation Circuit and a Wordline Voltage-Generating System for Embedded nor Flash Memory. IEEE Trans. Circuits Syst. II Express Briefs 61-II(9): 691-695 (2014) - [j9]Shengbo Zhang, Jun Xiao, Guangjun Yang, Jian Hu, Mingyong Huang, Shichang Zou:
A 1.35-V 16-Mb Twin-Bit-Cell Virtual-Ground-Architecture Embedded Flash Memory With a Sensing Current Protection Technique. IEEE Trans. Circuits Syst. I Regul. Pap. 61-I(10): 2862-2868 (2014) - 2013
- [j8]Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Ming Chen, Shichang Zou:
Comprehensive study on the TID effects of 0.13 μm partially depleted SOI NMOSFETs. Microelectron. J. 44(2): 86-93 (2013) - [j7]Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Zhiyuan Hu, Ming Chen, Shichang Zou:
Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs. Microelectron. Reliab. 53(2): 259-264 (2013) - [c1]Zhen Sheng, Zhiqi Wang, Chao Qiu, Le Li, Albert Pang, Aimin Wu, Xi Wang, Shichang Zou, Fuwan Gan:
A compact and CMOS compatible MMI coupler with very low excess loss. OFC/NFOEC 2013: 1-3 - 2012
- [j6]Bingxu Ning, Zhengxuan Zhang, Zhangli Liu, Zhiyuan Hu, Ming Chen, Dawei Bi, Shichang Zou:
Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology. Microelectron. Reliab. 52(1): 130-136 (2012) - 2011
- [j5]Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou:
Impact of within-wafer process variability on radiation response. Microelectron. J. 42(6): 883-888 (2011) - [j4]Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Zhangli Liu, Ming Chen, Dawei Bi, Shichang Zou:
The impact of total ionizing radiation on body effect. Microelectron. J. 42(12): 1396-1399 (2011) - [j3]Zhangli Liu, Zhiyuan Hu, Zhengxuan Zhang, Hua Shao, Ming Chen, Dawei Bi, Bingxu Ning, Shichang Zou:
Comparison of TID response in core, input/output and high voltage transistors for flash memory. Microelectron. Reliab. 51(6): 1148-1151 (2011) - [j2]Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou:
Total ionizing dose effects in elementary devices for 180-nm flash technologies. Microelectron. Reliab. 51(8): 1295-1301 (2011) - [j1]Jianhua Zhou, Albert Pang, Steam Cao, Shichang Zou:
Hole tunneling from valence band and hot-carrier induced hysteresis effect in 0.13 μm partially depleted silicon-on-insulator n-MOSFETs. Microelectron. Reliab. 51(12): 2077-2080 (2011)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-10-07 22:14 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by: