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Frédéric Saigné
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2020 – today
- 2020
- [c10]S. Guagliardo, Frederic Wrobel
, Ygor Q. Aguiar
Effect of Temperature on Single Event Latchup Sensitivity. DTIS 2020: 1-5 - [c9]Georgios Tsiligiannis, Antoine D. Touboul, Gaëtan Bricas, Tadec Maraine, Jerome Boch
Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning. DTIS 2020: 1-6 - [c8]Israel C. Lopes, Vincent Pouget, Frederic Wrobel
Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. LATS 2020: 1-6
2010 – 2019
- 2018
- [j8]Ygor Q. Aguiar
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. 88-90: 920-924 (2018) - 2017
- [j7]Frederic Wrobel
A calculation method to estimate single event upset cross section. Microelectron. Reliab. 76-77: 644-649 (2017) - [j6]Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel
Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. Microelectron. Reliab. 76-77: 650-654 (2017) - 2015
- [c7]Luigi Dilillo, Alexandre Bosser
Real-time SRAM based particle detector. IWASI 2015: 58-62 - 2013
- [j5]K. Guetarni, Antoine D. Touboul, Jerome Boch
Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model. Microelectron. Reliab. 53(9-11): 1293-1299 (2013) - [j4]Alain Michez, Jerome Boch
Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET. Microelectron. Reliab. 53(9-11): 1306-1310 (2013) - [c6]Elena I. Vatajelu
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell. DFTS 2013: 143-148 - [c5]Georgios Tsiligiannis
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations. IOLTS 2013: 145-150 - [c4]Georgios Tsiligiannis
Characterization of an SRAM based particle detector for mixed-field radiation environments. IWASI 2013: 75-80 - 2012
- [j3]Antoine D. Touboul, L. Foro, Frederic Wrobel
On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum. Microelectron. Reliab. 52(1): 124-129 (2012) - [c3]Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri
Evaluation of test algorithms stress effect on SRAMs under neutron radiation. IOLTS 2012: 121-122 - 2011
- [j2]Frederic Wrobel
MC-ORACLE: A tool for predicting Soft Error Rate. Comput. Phys. Commun. 182(2): 317-321 (2011) - [j1]R. Arinero, En-xia Zhang
High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors. Microelectron. Reliab. 51(12): 2093-2096 (2011) - [c2]Luigi Dilillo, Paolo Rech
Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench. LATW 2011: 1-6
2000 – 2009
- 2005
- [c1]Guillaume Hubert
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. IOLTS 2005: 87-94
Coauthor Index
aka: Frederic Wrobel
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