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Gerhard Pöppel
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2010 – 2019
- 2016
- [c5]Thomas Siegert, Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang:
A Nonnegative Tensor Factorization Approach for Three-Dimensional Binary Wafer-Test Data. ICMLA 2016: 842-845 - 2015
- [j7]Christoph Eichenseer, Gerhard Pöppel, Thomas Mikolajick:
Energy monitoring of high dose ion implantation in semiconductors via photocurrent measurement. Microelectron. Reliab. 55(9-10): 1369-1372 (2015) - 2014
- [j6]Reinhard Schachtner, Gerhard Pöppel, Ana Maria Tomé, Carlos García Puntonet, Elmar Wolfgang Lang:
A new Bayesian approach to nonnegative matrix factorization: Uniqueness and model order selection. Neurocomputing 138: 142-156 (2014) - [j5]Christoph Eichenseer, Gerhard Pöppel, Thomas Mikolajick:
Localization of temperature sensitive areas on analog circuits. Microelectron. J. 45(6): 734-739 (2014) - [j4]Reinhard Schachtner, Gerhard Pöppel, Ana Maria Tomé, Elmar Wolfgang Lang:
A Bayesian approach to the Lee-Seung update rules for NMF. Pattern Recognit. Lett. 45: 251-256 (2014) - 2011
- [j3]Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang:
Towards unique solutions of non-negative matrix factorization problems by a determinant criterion. Digit. Signal Process. 21(4): 528-534 (2011) - 2010
- [j2]Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang:
A Nonnegative Blind Source Separation Model for Binary Test Data. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(7): 1439-1448 (2010) - [c4]Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang:
Bayesian extensions of non-negative matrix factorization. CIP 2010: 57-62
2000 – 2009
- 2009
- [c3]Reinhard Schachtner, Gerhard Pöppel, Ana Maria Tomé, Elmar Wolfgang Lang:
Minimum Determinant Constraint for Non-negative Matrix Factorization. ICA 2009: 106-113 - [c2]Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang:
Binary Nonnegative Matrix Factorization Applied to Semi-conductor Wafer Test Sets. ICA 2009: 710-717 - 2008
- [c1]Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang:
Nonnegative Matrix Factorization for Binary Data to Extract Elementary Failure Maps from Wafer Test Images. GfKl 2008: 755-764 - 2002
- [j1]Tobias Rohatsch, Gerhard Pöppel, Heinrich Werner:
Robuste Indizes für Projection Pursuit. Inform. Forsch. Entwickl. 17(2): 53-59 (2002)
Coauthor Index
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