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Krishna B. Rajan

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1990 – 1999

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1996
[c2]
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  dblp key:
  - conf/vts/RajanLA96
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Krishna B. Rajan, David E. Long, Miron Abramovici:
Increasing testability by clock transformation (getting rid of those darn states). VTS 1996: 224-230
1992
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Miron Abramovici, Krishna B. Rajan, David T. Miller:
Freeze!: A New Approach for Testing Sequential Circuits. DAC 1992: 22-25

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