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Jiang-Lin Wei
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2020 – today
- 2023
- [c15]Haruo Kobayashi, Manato Hirai, Kakeru Otomo, Shogo Katayama, Xueyan Bai, Masashi Chiba, Zifei Xu, Dan Yao, Lengkhang Nengvang, Minh Tri Tran, Kanji Yoshihiro, Anna Kuwana, Takato Ooide, Hiroshi Tanimoto, Yuji Gendai, Jianglin Wei:
Back to the Analog Neural Network and Linear Circuit Theory. ASICON 2023: 1-4 - [c14]Jianglin Wei, Guangyi Xiao, Shun Peng, Hao Chen, Jingzhi Guo, Zhiguo Gong:
Fine-Grained Alignment for Boundary Samples under Open Set Domain Adaptation. ICME 2023: 2693-2698 - 2022
- [j4]Yao Yao, Tao Cheng, Zhenhui Sun
, Linlong Li
VecLI: A framework for calculating vector landscape indices considering landscape fragmentation. Environ. Model. Softw. 149: 105325 (2022) - [j3]Yujie Zhao
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. J. Electron. Test. 38(1): 21-38 (2022) - [j2]Jianglin Wei, Anna Kuwana, Haruo Kobayashi, Kazuyoshi Kubo:
IEEE754 Binary32 Floating-Point Logarithmic Algorithms Based on Taylor-Series Expansion with Mantissa Region Conversion and Division. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 105-A(7): 1020-1027 (2022) - [c13]Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel J. Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa:
Innovative Practices Track: Innovative Analog Circuit Testing Technologies. VTS 2022: 1 - 2021
- [j1]Jianglin Wei
Floating-Point Inverse Square Root Algorithm Based on Taylor-Series Expansion. IEEE Trans. Circuits Syst. II Express Briefs 68(7): 2640-2644 (2021) - [c12]Haruo Kobayashi, Xueyan Bai, Yujie Zhao, Shuhei Yamamoto, Dan Yao, Manato Hirai, Jianglin Wei, Shogo Katayama, Anna Kuwana:
Classical Mathematics and Analog/Mixed-Signal IC Design. ASICON 2021: 1-4 - [c11]Jianglin Wei, Anna Kuwana, Haruo Kobayashi, Kazuyoshi Kubo:
Divide and Conquer: Floating-Point Exponential Calculation Based on Taylor-Series Expansion. ASICON 2021: 1-4 - [c10]Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Gaku Ogihara, Daisuke Iimori, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
High Precision Measurement of Sub-Nano Ampere Current in ATE Environment. ATS 2021: 139-140 - [c9]Gaku Ogihara, Takayuki Nakatani, Daisuke Iimori, Shogo Katayama, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Jianglin Wei, Kazumi Hatayama, Haruo Kobayashi:
Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production. ICECS 2021: 1-6 - [c8]Shuhei Yamamoto, Yuto Sasaki, Yujie Zhao, Jianglin Wei, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Takayuki Nakatani, Minh Tri Tran, Shogo Katayama, Kazumi Hatayama, Haruo Kobayashi:
Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method. IOLTS 2021: 1-6 - [c7]Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies. ITC 2021: 284-288 - [c6]Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Akemi Hatta, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Yujie Zhao, Minh Tri Tran, Kazumi Hatayama, Haruo Kobayashi:
Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer. ITC 2021: 364-373 - [c5]Jianglin Wei, Anna Kuwana, Haruo Kobayashi, Kazuyoshi Kubo, Yuuki Tanaka:
Floating-Point Square Root Calculation Algorithm Based on Taylor-Series Expansion and Region Division. MWSCAS 2021: 774-778 - 2020
- [c4]Jianglin Wei
Revisit to Floating-Point Division Algorithm Based on Taylor-Series Expansion. APCCAS 2020: 240-243 - [c3]Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei
Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers. ATS 2020: 1-6
2010 – 2019
- 2019
- [c2]Jiang-Lin Wei
High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm. ASICON 2019: 1-4 - [c1]Yusuke Asada, Takahiko Shimizu, Yuji Gendai, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jiang-Lin Wei
Innovative Test Practices in Japan. VTS 2019: 1
Coauthor Index
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