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"A high-speed test-generation method using a test generation circuit."

Fumiyasu Hirose, Koichiro Takayama, Nobuaki Kawato (1990)

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DOI: 10.1002/SCJ.4690211102

access: closed

type: Journal Article

metadata version: 2023-09-13

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Fumiyasu Hirose, Koichiro Takayama, Nobuaki Kawato:
A high-speed test-generation method using a test generation circuit. Syst. Comput. Jpn. 21(11): 12-20 (1990)

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