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"Investigation on seal-ring rules for IC product reliability in 0.25-mum ..."

Shih-Hung Chen, Ming-Dou Ker (2005)

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DOI: 10.1016/J.MICROREL.2005.07.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Shih-Hung Chen, Ming-Dou Ker:
Investigation on seal-ring rules for IC product reliability in 0.25-mum CMOS technology. Microelectron. Reliab. 45(9-11): 1311-1316 (2005)

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